TEMP 2000A 便攜式紅外發射率/反射率測試儀

TEMP 2000A便攜式紅外發射率/反射率測定儀,可在3-35 微米范圍內測試半球反射率測試(total hemispherical reflectances) ,提供法線方向和 半球方向300K 環境條件下的發射率測定。

可取代已經停產的業界標準 Gier Dunkle DB 100 紅外反射率測定計,并在性能和保養性方面都優于該型號反射計。并配備電池、充電器等,以及適應噴氣式飛機飛行環境的便攜箱,緊湊、輕便、適合在野外和實驗室使用。符合ASTM E408 標準。

TEMP2000A中采用的光學元件、鍍膜材料決定了其還可以在更寬的波長范圍進行測試。

TESA2000是在TEMP 2000A基礎上增加光譜半球反射率測定功能,光譜范圍250 nm to 2500 nm ,主要用于太空材料太陽吸收特性測試。

Wavelength <3um to="">35um (not limited by filters, windows, etc.)
Measurement accuracy (for specular and diffuse samples) - ± 1% of full scale for gray samples 
- ± 3% of full scale for non-gray samples
Repeatability - ± 0.5% of full scale or better
Sample type Any Sample, including foils, insulators, etc.
Sample size and geometry -Flat Surfaces: ≥ 0.4 inches (1 cm) diameter
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Concave Surfaces: ≥ 6.5 inches (16.5 cm) diameter
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Convex Surfaces:  1 inch (2.5 cm) diameter
Sample temperature Room Temperature, Ambient
Displayed properties -Infrared Reflectance
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Normal Emittance (300K)
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Hemispheric emittance (300K)
Readouts

-Digital LCD panel meter
-Selectable IR emittance or reflectance display

Measurement range (reflectance) 0.00 to 1.00

Dimensions

-Optical Head: 5.25" diameter x 6.8" long
-Control and Display Unit: 4.5 x 7.75 x 7 inches
-Carry Case: 12.5 x 17 x 11 inches

Weight -Optical Head: 5 pounds
-Control and Display Unit: 4 pounds
-Carry Case: 11 pounds
Warranty 1 year parts and labor




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